Near Field Probe

Near-Field Probes

Near-field probes are used for accompanying measurements of high-frequency, electric and magnetic RF fields on assemblies and devices. Technical parameters for the single probes are available from the respective product articles and from the overview PDF as a download.

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  LF, Passive, 100 kHz up to 50 MHz

  The LF family consists of seven magnetic-field probes, four of which are included in our LF1 probe set. We are happy to create customized sets upon request.

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  RF, Passive, 30 MHz up to 3 GHz

  The RF family consists of nine magnetic field probes and six E-field probes, which are available in sets. These sets are optimized for different measurement tasks. We are happy to create customized sets upon request.

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  XF, Passive, 30 MHz up to 6 GHz

  The XF family consists of four magnetic-field probes and three E-field probes. The XF1 set (four magnetic-field probes and one E-field probe) as well as customized sets are available.

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  SX, Passive, 1GHz up to 20 GHz

  The SX family consists of three H-field probes and one E-field probe. The SX1 set (two H-field probes and one E-field probe) and the SX-R 20-1 set are available.

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  HR, Passive, up to 40 GHz

  The HR family consists of an H-field probe and an E-field probe for the measurement of high-frequency RF fields up to 40 GHz during development.

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  MFA, Active, 1MHz up to 6 GHz

  The MFA family consists of four active magnetic field probes. The MFA 01 includes three magnetic field probes. The MFA 02 set consists of two magnetic field probes for low frequency measurements.

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  CM-SHP (Customized Shapes)

  Langer EMV-Technik GmbH also manufactures special shapes of near-field probes according to customer requirements. Here are some examples.

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  Langer EMV - E1 set, Immunity Development System

  The E1 is a set of EMC tools used for EMI suppression in printed circuit boards during the development phase. The developer can use the E1 set to quickly identify the causes of burst and ESD interference. This allows the developer to design suitable measures to solve the causes of the interference. It can also be used to test the effectiveness of the measures taken. The E1 test set-up is small and fits easily on a developer’s desk. The E1 set user manual describes EMC mechanisms and provides detailed descriptions of basic measuring strategies for interference suppression in printed circuit boards. The E1 set includes a generator to generate burst and ESD disturbances.

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  Langer EMV - ICI-DP HH500-15 set, Double Pulse Mag

  The set ICI-DP HH500-15 set is designed to inject electromagnetic pulses with high temporal and spatial resolution into safety critical circuits (electromagnetic fault injection - EMFI). This set can be used to generate single pulses as well as a double pulse sequence with a pulse following time of minimum 25 ns. The set includes the high voltage source BPS 204 as well as the probe ICI-DP HH500-15.
  
  Via the sync inputs of the probe or the BPS, the pulses can be synchronized to an external function sequence.
  
  Parameters such as pulse voltage and polarity can be set via software.

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