Invisible Electromagnetic Wave, we can see with ERETEC’s technology.

The Best Solution Provider

for EMC, Antenna and Transient

EMPIRE XPU is a 3D time domainEM modeling tool for Antennas,
Microwave Circuits, EM Chip design and much more….

EMPIRE XPU is a 3D time domainEM modeling tool for Antennas,Microwave Circuits, EM Chip design and much more….

IMST-3D EM Simulation Tool -> EMPIRE XPU

Think to Things
Make your thinking to real things.

EMC Chamber perspective drawing

All about EMC Chambers

Your Trusted Partner in Global EMC & RF Testing Solutions

CHAMBER

The best quality chamber provider with a differentiated strategy of one-stop solution from design, construction, system integration to performance test.

Modern fighter jet showcased inside a hangar, linked to Eretech's military product menu.

Military

Large truck positioned inside an anechoic chamber, linked to Eretech's Automotive product menu.

Automotive

Scanning device positioned inside a calibration chamber, linked to Eretech's commercial product menu.

Commercial

Electronic device undergoing EMC testing inside an anechoic chamber, linked to Eretech's special product menu.

Special

Digital interface displaying smart chamber monitoring metrics, linked to Eretech's smart chamber product menu.

Smart Chamber

EMC Test System

Expert technologies and reliability decades long built through EMC test projects performed in lots of large companies and public organizations.

EMC Test System

Expert technologies and reliability decades long built through
EMC test projects performed in lots of large companies and public organizations.

EMI

EMS

TRS

Debugging System

Antenna Test System

Antenna measurement system and software developed by ERETEC meet customers’ specific
requirements with customized design compliant to OTA(Over the Air) standards.

OTA

OTA-MIMO System

MIMO-Rdiated Two-Stage Method

RSE Test System

PRODUCT

Reliable equipment supplier to wide range of customers from domestic and overseas manufacturers, government organizations, large companies, SME and EMC certification laboratories. Chamber ComponentShield Room Shield Room Provide reliable and optimal test condition by shielding electromagnetic noise from 14kHz to 40GHz. MORE EMP Protec

Vision Monitoring System
DATA Monitoring System
IC Scanner 4-Axis Positioning System
RCE Series
CM-SHP (Customized Shapes)
MFA, Active, 1MHz up to 6 GHz
HR, Passive, up to 40 GHz
SX, Passive, 1GHz up to 20 GHz

EUT’s image change tracking and data acquisition interfaced with vehicle immunity software .

Data change tracking and image acquisition of EUT by interfacing with immunity test software for vehicles.

The ICS 105 IC scanner allows for measurements of high-frequency near fields above ICs. Depending on the used ICR near-field microprobe magnetic or electric fields can be measured with a measuring resolution of 50 to 100 µm. The probe can also be automatically rotated to determine the magnetic field’s direction.

Optionally the ICS 105 scanner can be used for measurements above small assemblies in combination with UH-DUT universal holder and SH 01 probe holder.

The IC scanner can be set up for ESD or EFT immunity tests on ICs in a few simple steps.

The RCE Series is a high-performance Near-Field Scanning System capable of 3-axis simultaneous control (X, Y, Z) for EMC/EMI debugging. This system supports a wide frequency band from 30 MHz to 40 GHz and provides ultra-precise measurement of E/H field noise on the surface of PCBs and EUTs (Equipment Under Test) with a minimum step size of 0.1 mm.
Notably, it supports innovative scanning methods such as polygonal area scanning and automatic distance-keeping surface scanning of the EUT. This contributes decisively to reducing product development time by quickly and accurately identifying the noise sources of complex products.

Langer EMV-Technik GmbH also manufactures special shapes of near-field probes according to customer requirements.

The MFA family consists of four active magnetic field probes. The MFA 01 includes three magnetic field probes. The MFA 02 set consists of two magnetic field probes for low frequency measurements.

The HR family consists of an H-field probe and an E-field probe for the measurement of high-frequency RF fields up to 40 GHz during development.

The SX family consists of three H-field probes and one E-field probe. The SX1 set (two H-field probes and one E-field probe) and the SX-R 20-1 set are available.

News & Event

Here are the latest updates from ERETEC INC.