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Near-Field Probes
Near-field probes are used for accompanying measurements of high-frequency, electric and magnetic RF fields on assemblies and devices. Technical parameters for the single probes are available from the respective product articles and from the overview PDF as a download.
XF Passive Near-Field Probes (30 MHz to 6 GHz)
XF, Passive, 30 MHz up to 6 GHz
The XF family consists of four magnetic-field probes and three E-field probes. The XF1 set (four magnetic-field probes and one E-field probe) as well as customized sets are available.