Home » Product » Near Field Probe »
Near-Field Probes
Near-field probes are used for accompanying measurements of high-frequency, electric and magnetic RF fields on assemblies and devices. Technical parameters for the single probes are available from the respective product articles and from the overview PDF as a download.
SX Passive Near-Field Probes for Ultra-High-Frequency (1-20 GHz) Testing
SX, Passive, 1GHz up to 20 GHz
The SX family consists of three H-field probes and one E-field probe. The SX1 set (two H-field probes and one E-field probe) and the SX-R 20-1 set are available.