Near-Field Probes for EMC Diagnostics and Debugging
Near-Field Probes
Near-field probes are used for accompanying measurements of high-frequency, electric and magnetic RF fields on assemblies and devices. Technical parameters for the single probes are available from the respective product articles and from the overview PDF as a download.
The LF family consists of seven magnetic-field probes, four of which are included in our LF1 probe set. We are happy to create customized sets upon request.
The RF family consists of nine magnetic field probes and six E-field probes, which are available in sets. These sets are optimized for different measurement tasks. We are happy to create customized sets upon request.
The XF family consists of four magnetic-field probes and three E-field probes. The XF1 set (four magnetic-field probes and one E-field probe) as well as customized sets are available.
The SX family consists of three H-field probes and one E-field probe. The SX1 set (two H-field probes and one E-field probe) and the SX-R 20-1 set are available.
The HR family consists of an H-field probe and an E-field probe for the measurement of high-frequency RF fields up to 40 GHz during development.
The MFA family consists of four active magnetic field probes. The MFA 01 includes three magnetic field probes. The MFA 02 set consists of two magnetic field probes for low frequency measurements.
Langer EMV-Technik GmbH also manufactures special shapes of near-field probes according to customer requirements.
Langer EMV
Langer EMV - E1 set, Immunity Development System
The E1 is an EMC test tool set designed to support EMI suppression on Printed Circuit Boards (PCBs) during the development phase. Utilizing the E1 set, developers can rapidly identify the sources of Burst and ESD interference and engineer appropriate countermeasures. It is also useful for immediately testing the effectiveness of these solutions.
With its compact design, the E1 can be easily used in a developer's workspace. The provided user manual details EMC mechanisms and fundamental measurement strategies for interference suppression. The E1 set includes generators that create both Burst and ESD disturbances, allowing for the configuration of a realistic, in-situ testing environment.
Langer EMV - ICI-DP HH500-15 set, Double Pulse Magnetic Field Source set
The ICI-DP HH500-15 set is designed for Electromagnetic Fault Injection (EMFI) testing, which involves injecting electromagnetic pulses with high temporal and spatial resolution into safety-critical circuits.
This equipment enables precise testing by generating not only single pulses but also dual pulse sequences with a minimum interval of 25 nanoseconds (ns). The set includes the high-voltage source BPS 204 and the dedicated probe ICI-DP HH500-15. It also supports synchronization with external sequences via the synchronization input on either the probe or the BPS. Key parameters such as pulse voltage and polarity can be intuitively configured through software, ensuring both user-friendliness and practicality.