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IC Scanner 4-Axis Positioning System

The ICS 105 IC scanner allows for measurements of high-frequency near fields above ICs. Depending on the used ICR near-field microprobe magnetic or electric fields can be measured with a measuring resolution of 50 to 100 µm. The probe can also be automatically rotated to determine the magnetic field’s direction.

Optionally the ICS 105 scanner can be used for measurements above small assemblies in combination with UH-DUT universal holder and SH 01 probe holder.

The IC scanner can be set up for ESD or EFT immunity tests on ICs in a few simple steps.

IC Scanner 4-Axis Positioning System

ICS 105: 4-Axis Positioning System for Precision IC Scanner

ICS 105

The ICS 105 is a portable precision positioner optimized for EMC near-field scanning and high-resolution measurement, offering precise 3-axis control in 10 µm steps, ±180° rotational control, and high speed.

  • Supply Voltage
    110 / 230 V
  • Interface
    USB
  • Max. Traverse Range
    (50 x 50 x 50) mm; α-Rotation ±180°
  • Min. Step Size
    (10 x 10 x 10) µm; α-Rotation 1°
  • Positioning Speed
    (10 x 10 x 5) mm/s; α-Rotation 90°/s
  • Weight
    23 kg
  • Sizes (L x W x H)
    (350 x 400 x 420) mm
  • 3D scan
    3D map mesured by IC Scanner 4-Axis Positioning System
  • Surface scan
    Surface map mesured by IC Scanner 4-Axis Positioning System