EMC Scanner for PCB and Component EMI Diagnosis
EMC Scanner
EMC Scanner is a test equipment widely used in EMC laboratories and R&D departments which require EMC countermeasures at the development phase of PCB circuits and electronic components, and prompt measures against electromagnetic noise.
Developed and manufactured in Korea by Eretec, conveniently used by manufactures in mobile, IT products, semi-conductor, automotive, electronic components as well as many large companies and EMC certification laboratories.
The control software has very convenient UI and the function upgrade is provided to user’s demand.
The automotive control supports various kinds of signal analyzers from overseas as well as local. The recent R&D upgrade made possible of ESD visualization measurement of PCB and IC ChipScan test using near field micro probes.
The RCE Series is a high-performance Near-Field Scanning System capable of 3-axis simultaneous control (X, Y, Z) for EMC/EMI debugging. This system supports a wide frequency band from 30 MHz to 40 GHz and provides ultra-precise measurement of E/H field noise on the surface of PCBs and EUTs (Equipment Under Test) with a minimum step size of 0.1 mm. Notably, it supports innovative scanning methods such as polygonal area scanning and automatic distance-keeping surface scanning of the EUT. This contributes decisively to reducing product development time by quickly and accurately identifying the noise sources of complex products.
The ICS 105 IC scanner allows for measurements of high-frequency near fields above ICs. Depending on the used ICR near-field microprobe magnetic or electric fields can be measured with a measuring resolution of 50 to 100 µm. The probe can also be automatically rotated to determine the magnetic field’s direction. Optionally the ICS 105 scanner can be used for measurements above small assemblies in combination with UH-DUT universal holder and SH 01 probe holder. The IC scanner can be set up for ESD or EFT immunity tests on ICs in a few simple steps.